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A Review on the Study of Temperature Effects in the Design of A/D Circuits based on CNTFET

[ Vol. 15 , Issue. 5 ]


Roberto Marani and Anna Gina Perri*   Pages 471 - 480 ( 10 )


In this paper, we review a procedure to study the effects of temperature in the design of A/D circuits based on CNTFETs. At first, we briefly describe a compact model, already proposed by us, in which the temperature variation in the drain current equation and in energy band gap is considered. Then, the effects of temperature variations in the design of analog circuits, such as a cascode current sink mirror and an Operational Transconductance Amplifier (OTA), and in the design of digital circuits including in particular NAND and NOR logic gates, are illustrated and widely discussed.


CNTFETs, modeling, temperature effects, analogue circuits, digital circuits, CAD, verilog-A.


Institute of Intelligent Industrial Technologies and Systems for Advanced Manufacturing, National Research Council (CNR), Rome, Department of Electrical and Information Engineering, Electron Devices Laboratory, Polytechnic University of Bari, Bari

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